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Polyethylene and Polypropylene compounds Surface NanomorphologyAnalyzed by Differential Evanescent Light Intensity (DELI)

S. A. POPESCU1, A. PELED2,* , N. MIRCHIN2, I. LAPSKER2, P. V. NOTINGHER1

Affiliation

  1. Electrical Engineering Faculty, Politehnica University of Bucharest, 313 Splaiul Independentei Str., 060042, Bucharest, Romania
  2. Engineeering Faculty, Holon Institute of Technology, 52 Golomb Str., Holon 58102, Israel

Abstract

In this work, the nanometer profile of Polyethylene (PE) and Polypropylene (PP) dielectric materials used typically as insulators in the electrical industry have been investigated by the new optical microscopy method termed Differential Evanescent Light Intensity (DELI). The dielectric materials investigated were of 4 kinds: pure Polyethylene (PE) and Polypropylene (PP) and their compounds doped with 20% Amidon and Cellofiber respectively. The dielectric materials were deposided by melting them on optical glass waveguides for analyzing by DELI which is a version of Evanescent Light Tunneling Microscopy assisted by computer image processing method. The results showed differences in the surface nanostructure profiles and morphology of the films deposited on glass for the various dielectric materials..

Keywords

Dielectrics, Nanocomposites, Evanescent light.

Submitted at: April 10, 2009
Accepted at: June 28, 2009

Citation

S. A. POPESCU, A. PELED, N. MIRCHIN, I. LAPSKER, P. V. NOTINGHER, Polyethylene and Polypropylene compounds Surface NanomorphologyAnalyzed by Differential Evanescent Light Intensity (DELI), Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 6, pp. 887-891 (2009)