"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Preparation and characterization of Copper/Nikel nanostructurated multilayers using thermionic vacuum Arc method

D. ILIE1, D. RĂSLEANU1, V. IONESCU1, V. MOCANU1, M. G. MUREŞAN1, I. M. OANCEA-STĂNESCU1,* , V. CIUPINĂ1, G. PRODAN1, E. VASILE2, I. MUSTAŢĂ3, V. ZAROSCHI3, C. P. LUNGU3

Affiliation

  1. Department of Physics, Ovidius University, Mamaia Avenue No. 124, Constanta, 900527, Romania
  2. Metav-CD S.A., C.A. Rosetti Street No. 31, Bucharest, 050025, Romania
  3. National Institute for Laser, Plasma and Radiation Physics, Atomistilor Street No. 409C, Magurele, 077125, Romania

Abstract

Copper and nickel multilayers were prepared in order to obtain nanostructured giant magnetoresistive (GMR) thin films. In this respect we followed the original method of thermionic vacuum arc (TVA), which uses an external source of electrons for the creation of both metal vapors and metal ions. The low arc currents used in this case allow gentle evaporation of the anode material, which results in high smoothness of the films. The deposition thicknesses were controlled to be of 2.5-10 nm for Cu and 4-10 nm for Ni, using a Cressington quartz balance monitor. Morphology and structure of the prepared films were analyzed using electron microscopy techniques (transmission electron and scanning electron microscopy, energy dispersive X-ray spectroscopy). The thickness of the Cu layer influence on the properties of the prepared film was inferred in correlation with giant magneto-resistive effect..

Keywords

Nanostructurated layers, TVA, SEM, EDAX, HR-TEM.

Submitted at: April 7, 2010
Accepted at: April 26, 2010

Citation

D. ILIE, D. RĂSLEANU, V. IONESCU, V. MOCANU, M. G. MUREŞAN, I. M. OANCEA-STĂNESCU, V. CIUPINĂ, G. PRODAN, E. VASILE, I. MUSTAŢĂ, V. ZAROSCHI, C. P. LUNGU, Preparation and characterization of Copper/Nikel nanostructurated multilayers using thermionic vacuum Arc method, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 4, pp. 839-843 (2010)