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Profile measurement using rotated digital image correlation

J. R. PARRA MICHEL1,* , DAVID ASAEL GUTIÉRREZ HERNÁNDEZ1,2, MARCO A. ESCOBAR3, ALMA CAMACHO-PÉREZ1, RAFAEL MARTÍNEZ-PELÁEZ1

Affiliation

  1. Escuela de Ingenierías. Universidad De La Salle Bajío, Av. Universidad 602, Col. Lomas del Campestre, León, Guanajuato, México
  2. Tecnológico Nacional de México. Instituto Tecnológico de León. División de Estudios de Posgrado e Investigación. Avenida Tecnológico s/n, Industrial Julián de Obregón, 37290 León, Guanajuato, México
  3. Universidad De La Salle Bajío campus Salamanca. Libramiento a Morelia km 7.5 Poblado de San Juan de Razos, 36700, Salamanca, Gto., México.

Abstract

An optical technique based on a rotated digital image correlation for measuring the full topographic field profile of a surface is proposed. The mathematical models, and possible sources of errors during measurements, are presented and properly analyzed. A comparison between measured results for regular and irregular surfaces, and their respective physical models, is shown. Experimental resolutions of down to10 microns can be obtained..

Keywords

Phase Retrieval, Fringe Projection, Profilometry, Digital Image Correlation.

Submitted at: Sept. 7, 2016
Accepted at: April 6, 2017

Citation

J. R. PARRA MICHEL, DAVID ASAEL GUTIÉRREZ HERNÁNDEZ, MARCO A. ESCOBAR, ALMA CAMACHO-PÉREZ, RAFAEL MARTÍNEZ-PELÁEZ, Profile measurement using rotated digital image correlation, Journal of Optoelectronics and Advanced Materials Vol. 19, Iss. 3-4, pp. 167-172 (2017)