Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Radial vectored features for pattern enveloping and retrieval



  1. Digital Electronics and Communication Division, Centre for Development of Advanced Computing (C-DAC), Mohali – 160 071 India
  2. Department of Electronics and Communication Engineering, Chandigarh University, Gharuan, Mohali, India
  3. Department of Electronics and Communication Engineering, CEC, Landran, Mohali India


Radial vectored features are presented to draw an envelope of the pattern under test and its retrieval. Enveloping a given pattern is an important activity while tracking a moving object. The ordered radial profile is used to draw the envelope of the pattern, while the sorted radial profile is used to identify/recognize/categorize the pattern under test. The radial profile is computed around the centre of mass of the binary pattern. Maximum and minimum radii are accounted for figure aspect and broad symmetry about x- and y-axis. Mean, variance, standard deviation of radii, area, perimeter and Euler number give the degree of matching of the pattern to that from the existing data base, otherwise a new category is generated..


Centre of Mass (CoM), Pattern Recognition, Radial Profile, Standard Deviation, Euler Number, Discrete Cosine Transform (dct).

Submitted at: Feb. 17, 2016
Accepted at: Sept. 29, 2016


V. GOEL, B. S. SOHI, H. SINGH, Radial vectored features for pattern enveloping and retrieval, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 9-10, pp. 878-883 (2016)