"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Reflection and transmission in a heterostructured multilayer narrowband filter containing thin metallic films

YANG-HUA CHANG1, CHI-CHUNG LIU2, TZONG-JER YANG3, CHIEN-JANG WU4,*

Affiliation

  1. Department of Electronic Engineering, National Yunlin University of Science and Technology, Douliou, Yunlin 640, Taiwan
  2. Graduate School of Engineering Science and Technology, National Yunlin University of Science and Technology, Douliou, Yunlin 640, Taiwan
  3. Department of Electrical Engineering, Chung Hua University, Hsinchu 300, Taiwan
  4. Institute of Electro-Optical Science and Technology, National Taiwan Normal University, Taipei 116, Taiwan

Abstract

A narrowband filter with two reflection peaks and a single transmission peak is proposed based on a multilayer heterostructure containing two different ultrathin metallic films. The heterostructure filter is formed by cascading two narrowband reflection-and-transmission filters. We use the transfer matrix method to calculate the optical reflectance, transmittance, and absorptance for this filter. Results show that the heterostructure has a pronounced effect on the reflectance, leading to two resonant peaks. The angular dependence of filtering properties is also investigated. This filter is of practical use in the optical signal processing..

Keywords

Narrowband filters, Heterostructures, Transfer matrix method.

Submitted at: April 19, 2010
Accepted at: March 16, 2011

Citation

YANG-HUA CHANG, CHI-CHUNG LIU, TZONG-JER YANG, CHIEN-JANG WU, Reflection and transmission in a heterostructured multilayer narrowband filter containing thin metallic films, Journal of Optoelectronics and Advanced Materials Vol. 13, Iss. 3, pp. 268-272 (2011)