Cookies ussage consent
Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.
I agree, do not show this message again.Refractive index and oscillator parameters in TlGaS2, TlGaSe2 and TlInS2 layered crystals
N. M. GASANLY1
Affiliation
- Department of Physics, Middle East Technical University, 06531 Ankara, Turkey
Abstract
The optical properties of TlGaS2, TlGaSe2, and TlInS2 crystals have been investigated through the transmission and reflection measurements at room temperature in the wavelength range of 400−1100 nm. These measurements allowed determination of spectral dependence of the refractive index for all crystals studied. The dispersion of the refractive index is discussed in terms of the Wemple-DiDomenico single-effective-oscillator model. The refractive index dispersion parameters: the oscillator energies, the dispersion energies, and the zero-frequency dielectric constants and refractive indices were determined..
Keywords
Optical properties, Refractive index, Semiconductors.
Submitted at: Dec. 9, 2010
Accepted at: Jan. 26, 2011
Citation
N. M. GASANLY, Refractive index and oscillator parameters in TlGaS2, TlGaSe2 and TlInS2 layered crystals, Journal of Optoelectronics and Advanced Materials Vol. 13, Iss. 1, pp. 49-52 (2011)
- Download Fulltext
- Downloads: 359 (from 239 distinct Internet Addresses ).