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Role of firing temperature on structural and electrical characteristics of Titania thick film for sensor applications

S. J. PATIL1,2, K. S. THAKARE3, N. B. SONAWANE4, N. G. DESHPANDE5, R. R. AHIRE1,*

Affiliation

  1. Department of Physics, S. G. Patil Arts, Science & Commerce College, Sakri-424304, Dist. Dhule, (M.S.), India
  2. Department of Physics, L. V. H. College, Panchavati, Nashik - 422003, (M. S.), India
  3. Department of Physics, M. S. G. College, Malegaon Camp, Malegaon- 423105,Dist. Nashik, (M. S.), India
  4. Department of Physics, K. A. M. Patil College, Pimpalner, Dist- Dhule, (M. S.), India
  5. Department of Physics, Shivaji University, Kolhapur-416004, (M. S.), India

Abstract

Titania (TiO2) thick films have been prepared by standard screen printing technique and subsequently fired at different temperatures (viz. 623, 723 and 823K) in air atmosphere. The role of firing temperature (FT) on various physical properties such as structural, surface morphological, compositional, electrical resistivity, Temperature Coefficient of Resistance (TCR) and activation energy have been studied. Compositional studies revealed that the thick films were oxygen deficient, indicating that they were non- stoichiometric in nature. It was observed from XRD studies that all the samples (i.e., as-deposited as well as fired) were polycrystalline in nature. Interestingly, with increase in FT the structural phase changed from anatase to a mix-phase i.e., anatase-rutile. Moreover, the effect of FT on structural parameters such as grain-size and surface-area revealed that with increase in FT, grain growth takes place, which thereby decreases the surface-area. This grain growth and increase in crystallinity with FT was equally corroborated from Field Emission Scanning Electron Microscopy (FESEM) images. Electrical property studies showed that resistance decreases with increase in temperature indicating semiconductor behavior for all the samples. Further, it is found that TiO2 thick films have two activation energies at low and high temperature regions.

Keywords

O2 thick films, FESEM, Structural properties, Electrical properties.

Submitted at: Feb. 18, 2014
Accepted at: May 7, 2015

Citation

S. J. PATIL, K. S. THAKARE, N. B. SONAWANE, N. G. DESHPANDE, R. R. AHIRE, Role of firing temperature on structural and electrical characteristics of Titania thick film for sensor applications, Journal of Optoelectronics and Advanced Materials Vol. 17, Iss. 5-6, pp. 655-659 (2015)