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Structural and optical characterization of PVP-capped lead oxide nanocrystalline thin films

S. C. EZUGWU1,* , P. U. ASOGWA1, F. I. EZEMA1, P. M. EJIKEME2

Affiliation

  1. Department of Physics and Astronomy, Faculty of Physical Sciences, University of Nigeria, Nsukka
  2. Department of Chemistry, Faculty of Physical Sciences, University of Nigeria, Nsukka

Abstract

Chemical bath deposition of semiconductor nanocrystalline thin films has been carried out within the pores of polyvinyl pyrrolidon (PVP) at room temperature. The chemical bath for the deposition of lead oxide is made up of lead acetate (Pb(CH3COO)2), ammonia (NH3) and PVP solution. The deposited films were annealed in the oven at a temperature of between 100o C and 300o C and characterized for the structural and optical properties. These properties were studied by means of X-ray diffraction (XRD) and optical spectrophotometer. XRD studies revealed the formation of nanocrystalline thin films. The results also show that high temperature annealing has significant effect on the structure and stiochiometry of lead oxide film deposited. From the absorption spectra, the band gap energy for lead oxide thin films lies in the range of 2.0 – 2.5eV..

Keywords

CBD, Grain size, Optical properties, Stiochiometry, XRD.

Submitted at: April 7, 2010
Accepted at: Aug. 12, 2010

Citation

S. C. EZUGWU, P. U. ASOGWA, F. I. EZEMA, P. M. EJIKEME, Structural and optical characterization of PVP-capped lead oxide nanocrystalline thin films, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 8, pp. 1765-1771 (2010)