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Structural and optical characterization of ZnO thin films deposited by sol-gel method

A. SINGH1,2, A. KUMAR2, N. SURI1,* , S. KUMAR3, M. KUMAR2, P. K. KHANNA1, D. KUMAR2

Affiliation

  1. Hybrid Microcircuit Group, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific and Industrial Research (CSIR), Pilani-333031 (Rajasthan) India
  2. Electronic Science Department, Kurkshetra University, Kurukshetra
  3. Nano Science and Nano Technology Unit, Indian Institute of Technology, Kanpur

Abstract

Zinc oxide is a promising semiconductor material with a variety of applications. Transparent, highly crystalline and crackfree film was deposited on corning glass. A transparent sol of 0.33 mol/l was prepared by dissolving Zinc acetate dihydrate in 2-methoxyethanol using mono-ethanolamine as sol stabilizer. Addition of few drops of water turns the sol immediately into milky gel form. The film was annealed in oxygen environment at 500ºC for one hour and characterized by X-ray diffraction, Atomic force microscopy, UV-VIS spectroscopy and Raman spectroscopy. Thickness and roughness was measured by Surface profiler..

Keywords

Raman spectroscopy, Sol-gel, Zinc oxide.

Submitted at: March 5, 2009
Accepted at: June 28, 2009

Citation

A. SINGH, A. KUMAR, N. SURI, S. KUMAR, M. KUMAR, P. K. KHANNA, D. KUMAR, Structural and optical characterization of ZnO thin films deposited by sol-gel method, Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 6, pp. 790-793 (2009)