Cookies ussage consent
Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.I agree, do not show this message again.
S. KUMARI1,* , S. YADAV2, D. MOHAN1
- Dept. of Physics,G. J. U. S. & T. Hisar-125001, Haryana , India
- Dept of Physics,Baba Mastnath University Asthal Bohar, Rohtak-124001, Haryana , India
The conventional melt quench technique was used to synthesize the bulk glass of composition 60TeO2.12Bi2O3.18B2O3.10ZnO, and the thin film was deposited by thermal evaporation technique. X-ray diffraction patternreveals the amorphous nature of the material under study. The direct bandgap of as-deposited thin films and bulk glass has been calculated using Tauc’s Plot and found to be 3.0 eV and 2.81 eV, respectively. Nonlinear optical parameters of bulk and thin-film glasses have been estimated using semi-empirical relations. Nonlinear optical susceptibility has found to be 1.272 ×10-13esu (bulk) and 1.810×10-13esu (thin film), respectively. The nonlinear refractive index has been estimated for both bulk (2.733×10-12) and thin-film (3.773 ×10-12). The high nonlinearity of the thin-film is useful as potential applications in optoelectronic devices..
Nonlinear refractive index, Third order nonlinear susceptibility, Thermal evaporation.
Submitted at: Feb. 18, 2020
Accepted at: Dec. 7, 2020
S. KUMARI, S. YADAV, D. MOHAN, Structural, linear and nonlinear optical properties of multicomponent bulk and thin film tellurite glass, Journal of Optoelectronics and Advanced Materials Vol. 22, Iss. 11-12, pp. 606-612 (2020)
- Download Fulltext
- Downloads: 50 (from 39 distinct Internet Addresses ).