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Structural, morphological and optical studies of chemically developed annealed Cu doped CdS nanofilms

S. KUMAR1, AFTAB ALAM2, D. K. SINGH3, S. K. SHARMA4, S. R. KUMAR5, S. RAJPAL6,*

Affiliation

  1. Department of Physics, Chaibasa Engineering College, chaibasa, J harkhand, 833215, India
  2. Department of Engineering Physics, Al-Kabir polytechnic, Jamshedpur, Jharkhand -831012, India
  3. Department of Physics, P.K. Roy Memorial College, Dhanbad, Jharkhand-826004, India
  4. Department of Physics, Indian Institute of Technology (IIT-ISM), Dhanbad, Jharkhand-826004, India
  5. Department of Applied Science, National Institute of Advanced Manufacturing Technology, Hatia, Ranchi-83400, India
  6. Department of Physics, Government Engineering College Munger, Bihar- 811201, India

Abstract

In this work, Cu doped CdS thin films were developed by chemical bath deposition technique at 140ᵒC on ITO glass substrate. The film was annealed at 350ᵒC in air. By using XRD, FESEM, WCA, UV-VIS, and FTIR the structural, morphological, and optical characteristics of the films were examined. The samples appear to be polycrystalline based on X-ray diffraction (XRD) data, and other characteristics including crystallite size, micro strain, and dislocation density were evaluated. A FESEM analysis reveals that uniform distribution grains with spherical shapes cover the entire substrate surface. The bandgap of thin films was calculated using Tauc theory with increase of annealing temperature. Based on the results of these experiments, the potential for using Cu doped CdS films as a window layer was studied..

Keywords

Characterization, XRD, FESEM, Non-aqueous, Cu doped CdS, Thin films.

Submitted at: Nov. 20, 2023
Accepted at: Dec. 2, 2024

Citation

S. KUMAR, AFTAB ALAM, D. K. SINGH, S. K. SHARMA, S. R. KUMAR, S. RAJPAL, Structural, morphological and optical studies of chemically developed annealed Cu doped CdS nanofilms, Journal of Optoelectronics and Advanced Materials Vol. 26, Iss. 11-12, pp. 496-502 (2024)