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Structural properties and epitaxial growth mechanisms of nanoscale Bi2Sr2CaCu2Oy thin films

A. V. POP1,* , S. MANOLACHE1, R. COLDEA1, M. POP2

Affiliation

  1. Faculty of Physics, University Babes-Bolyai, 400084 Cluj-Napoca, Romania
  2. Technical University Cluj-Napoca, Faculty of Materials Science and Engineering, Department of Materials Processing Engineering, Romania

Abstract

Bi2Sr2CaCu2Oy (Bi:2212) nanoscale films were deposited on LaAlO3 substrate by d.c. magnetron sputtering. The growth conditions for the deposition have been optimized. X-ray diffraction shows that the films are single Bi:2212 phase, epitaxial and oriented with their c-axis perpendicular to the substrate surface. The growth mechanisms of Bi:2212 have been studied by atomic force microscopy (AFM) on various nanoscale thin films..

Keywords

Bi:2212 thin film, DC magnetron sputtering, Growth conditions, XRD, AFM.

Submitted at: Feb. 25, 2008
Accepted at: April 4, 2008

Citation

A. V. POP, S. MANOLACHE, R. COLDEA, M. POP, Structural properties and epitaxial growth mechanisms of nanoscale Bi2Sr2CaCu2Oy thin films, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 4, pp. 919-921 (2008)