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Structural study of (Se80Te20)100-xAgx bulk samples using XRD spectra: Applicability of Piloyan–Borchardt method

DIGVIJAY SINGH1, SANDEEP KUMAR1, R. THANGARAJ1,*

Affiliation

  1. Semiconductors Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar-143005, Punjab, India

Abstract

The XRD analysis has been carried out on pristine and annealed bulk samples of (Se80Te20)100-xAgx (1≤x≤4) glassy system. XRD traces of all the samples have been taken out at the room temperature. The absence of the sharp peaks in the pristine bulk samples confirmed the amorphous nature but the presence of sharp peaks in the XRD pattern of annealed samples confirmed the presence of Se8 and Ag5Te3 phase in the bulk material. The particle size has been calculated by the Scherrer’s formula and found to be in the range of 0.008277um to 0.038694um. Activation energy of crystallization of glassy system has been obtained by Piloyan-Borchardt method for both phases at different x values as well as at different heating rates. It has been found that the value of activation energy of crystallization is highest for x= 3 and lowest for x= 1..

Keywords

XRD, Average particle size. Se-Te-Ag system.

Submitted at: Oct. 9, 2010
Accepted at: Nov. 19, 2010

Citation

DIGVIJAY SINGH, SANDEEP KUMAR, R. THANGARAJ, Structural study of (Se80Te20)100-xAgx bulk samples using XRD spectra: Applicability of Piloyan–Borchardt method, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 11, pp. 2242-2246 (2010)