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Study of structure and optical properties of CdSe thin films

V. CIUPINA1,* , A. PETCU1, P. RAMBU2, C. BABAN2, L. C. PETCU1, G. PRODAN1, G. I. RUSU2, V. POMAZAN1

Affiliation

  1. Universitatea “Ovidius” Constanta
  2. “Al.I. Cuza” University, 11 Carol I Bd., 700506 Iasi, Romania

Abstract

This paper reports optical properties study of thermal vapour deposited CdSe thin films on glass substrate. The films thickness of 0.21-1.24 µm was measured using an interferometric method. The CdSe thin film was investigated with TEM, SAED, XRD, and AFM techniques. A hexagonal structure was revealed for all investigated samples. The optical absorption spectra obtained were in the 400-1400 nm range. The maximum and minimum in the spectra are due to the multiple reflexion on the surfaces of the film, indicating that the samples were uniform. The refraction index and the band gap Eg of CdSe films were determined from the absorption spectra..

Keywords

CdSe thin films, Structure, TEM, SAED, XRD, AFM, Optical properties.

Submitted at: Sept. 1, 2008
Accepted at: Nov. 11, 2008

Citation

V. CIUPINA, A. PETCU, P. RAMBU, C. BABAN, L. C. PETCU, G. PRODAN, G. I. RUSU, V. POMAZAN, Study of structure and optical properties of CdSe thin films, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 11, pp. 2993-2995 (2008)