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- Department of Physics, AMET University, Kanathur, Chennai-603112, India
Lead telluride (PbTe) thin films were synthesized using the Chemical Bath Deposition (CBD) technique. X-ray diffraction (XRD) analysis was used to study the structure and the crystallite size of PbTe thin film. The surface morphology of PbTe thin films were studied using scanning electron microscopy (SEM) and atomic force microscopy (AFM). The optical properties were studied using the UV-Visible absorption spectrum. The optical constants such as band gap, refractive index, extinction coefficient and electric susceptibility were determined from UV-Visible absorption spectrum. The dielectric constant, dielectric loss and ac conductivity of the PbTe thin films were studied at different temperatures and frequencies to analyze the electrical properties..
PbTe thin films, XRD, SEM, AFM, Dielectric studies.
Submitted at: Nov. 5, 2015
Accepted at: Feb. 10, 2016
S. SAGADEVAN, Synthesis and characterization of lead chalcogenide thin films, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 1-2, pp. 29-33 (2016)
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