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I agree, do not show this message again.The effect of annealing temperatures on magnetic and electric properties of electrodeposited Ni85,3Fe10,6W1,4Cu2,2 alloy
Z. VUKOVIĆ1, P. SPASOJEVIĆ2, M. PLAZINIĆ1, J. ŽIVANIĆ1, M . SPASOJEVIĆ1,3,*
Affiliation
- Joint Laboratory for Advanced Materials of the Serbian Academy of Science and Arts, Section for Amorphous Systems, Svetog Save 65, 32000 Čačak, Serbia
- Faculty of Technology and Metallurgy, University of Belgrade, Karnegijeva 4,11000 Belgrade, Serbia
- Faculty of Agronomy Čačak, University of Kragujevac, Cara Dusana 34, 32000 Čačak, Serbia
Abstract
Ni85,8 Fe10,6 W1,4 Cu2,2 alloy powder consisting of an amorphous matrix and nanocrystals of an FCC solid solution of Fe, W and Cu in nickel was produced by electrodeposition. Heating the pressed powder sample over the temperature range of 20 to 600°C permitted structural changes to take place in the alloy, causing changes in its electrical resistivity and magnetic permeability. The alloy exhibits structural stability up to 150°C. In the temperature interval 150-360°C, the alloy undergoes intensive structural relaxation resulting in an increase in electrical conductivity and magnetic permeability. Less intensive structural relaxation occurs at temperatures between 360°C and 460°C. In this interval, under heat treatment, magnetic domain arrangement decreases and, hence, the interaction between magnons and conduction electrons is reduced, leading to a decrease in the temperature coefficient of electrical resistivity (TCER). Amorphous matrix crystallization and FCC crystal growth take place in the temperature interval 460-520°C, causing a decline in electrical resistivity and magnetic permeability..
Keywords
Nanostructured alloy, FCC phase, Permeability, Electrical resistivity.
Submitted at: Sept. 9, 2013
Accepted at: July 10, 2014
Citation
Z. VUKOVIĆ, P. SPASOJEVIĆ, M. PLAZINIĆ, J. ŽIVANIĆ, M . SPASOJEVIĆ, The effect of annealing temperatures on magnetic and electric properties of electrodeposited Ni85,3Fe10,6W1,4Cu2,2 alloy, Journal of Optoelectronics and Advanced Materials Vol. 16, Iss. 7-8, pp. 985-989 (2014)
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