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The influence of sample refraction in the X ray LLL i nterferometer

JIE WU1,* , JIABI CHEN1

Affiliation

  1. School of Medical Instrument and Food Engineering, University of Shanghai for Science and Technology, Shanghai, 200093, P. R. China

Abstract

An interferometry method based on the X-ray crystallography is explored to the measurement of refractive index, and a triple Laue case(LLL) interferometer configuration is formed according to the dynamical theory of X ray diffraction diffraction. Then several aspects about the X-rays refraction phenomenon originated by the sample, the deviation of the X-ray incident angle from the Bragg diffraction angle, and the shift distance of the exit point, are discussed to find the influence of analyzer parameters on the interference signal of the X ray LLL interferometer, and computer simulations are made to reveal the relationship between the analyzer thickness and the shift distance of the exit point, and an optimization scheme about the analyzer parameter are presented to improve the spatial resolution for the X- ray interferometer..

Keywords

X-ray, Interferometer, Crystal, Refractive index.

Submitted at: May 5, 2014
Accepted at: May 7, 2015

Citation

JIE WU, JIABI CHEN, The influence of sample refraction in the X ray LLL i nterferometer, Journal of Optoelectronics and Advanced Materials Vol. 17, Iss. 5-6, pp. 563-567 (2015)