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Transmission electron microscopy analysis and electrical measurements of carbon thin films

I. M. OANCEA-STANESCU1,* , V. CIUPINA1, G. PRODAN1, M. PRODAN1, A. CARAIANE1, N. DULGHERU1, I. JEPU2, C. P. LUNGU2

Affiliation

  1. Ovidius University of Constanta, Mamaia Avenue 124, 900527 Constanta, Romania
  2. National Institute for Laser Plasma and Radiation Physics, Magurele, 077125, Romania

Abstract

The paper performs studies on carbon thin films based on electron microscopy data and electrical measurements are reported. The samples were obtained by Thermionic Vacuum Arc (TVA) method. Techniques used to acquire information were BF-TEM (Bright Field Transmission Electron Microscopy), DF-TEM (Dark Field Transmission Electron Microscopy), HRTEM (High Resolution Transmission Electron Microscopy), SAED (Selected Area Electron Diffraction) and Radial Distribution Function (RDF)..

Keywords

Carbon, Thermionic Vacuum Arc, High Resolution Transmission Electron Microscopy, Selected Area Electron Diffraction, Radial Distribution Function.

Submitted at: April 7, 2010
Accepted at: April 26, 2010

Citation

I. M. OANCEA-STANESCU, V. CIUPINA, G. PRODAN, M. PRODAN, A. CARAIANE, N. DULGHERU, I. JEPU, C. P. LUNGU, Transmission electron microscopy analysis and electrical measurements of carbon thin films, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 4, pp. 824-828 (2010)