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Vacuum thermal evaporated (AsSe)1-x(AgI)x films: studies by spectroscopic ellipsometry and atomic-force microscopy♣

T. HINEVA1,* , A. SZEKERES2, P. PETKOV1, M. ANASTASESCU3, M. GARTNER3, K. SALAMON4

Affiliation

  1. Laboratory of Thin Films Technology, Department of Physics, University of Chemical Technology and Metallurgy, 8 Kl. Ohridsky blvd, 1756 Sofia, Bulgaria
  2. Institute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee Blvd., 1784 Sofia, Bulgaria
  3. Institute of of Physical Chemistry, Spl Independentei 202, Bucharest 060021, Romania
  4. Institute for Physics, Bijenicka cesta 46, 10000 Zagreb, Croatia

Abstract

Vacuum thermal evaporated (AsSe)1-x(AgI)x films with different compositions (x = 5, 15, 20 and 30 mol % ) have been studied by spectroscopic ellipsometry and atomic-force microscopy. The ellipsometric results have shown that the optical constants and optical band gap energy values vary with increasing AgI content in the films. Additional XRD measurements revealed that the films are amorphous with more ordered structures at larger x values. AFM images visualized that randomly distributed hillocks emerged from the smooth film surface yielding an rms roughness of 0.6-1.0 nm with a tendency to increase with increasing AgI content..

Keywords

Chalcogenide thin films, Optical properties, AFM imaging, Spectroscopic ellipsometry.

Submitted at: Nov. 5, 2008
Accepted at: Sept. 9, 2009

Citation

T. HINEVA, A. SZEKERES, P. PETKOV, M. ANASTASESCU, M. GARTNER, K. SALAMON, Vacuum thermal evaporated (AsSe)1-x(AgI)x films: studies by spectroscopic ellipsometry and atomic-force microscopy♣, Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 9, pp. 1265-1268 (2009)