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X-Ray diffraction and Raman spectra of As4S3Se3-Sn glasses

O.V. IASENIUC1,* , M.S. IOVU1, G. F. VOLODINA1, M. ENACHESCU2, D. DINESCU2

Affiliation

  1. Institute of Applied Physics, Academy of Sciences of Moldova, MD-2028 Chisinau, R. Moldova
  2. Centre for Science and Nanotechnology, Splaiul Independentei 313, Bucharest, Romania

Abstract

The XRD measurements showed that the Sn atoms introduced in As4S3Se3-Sn glasses (Sn=010 %) don’t change essentially the shape of the first sharp diffraction peak (FSDP) of the X-ray diffraction patterns, the intensity and the position of the FSDP non-monotoniously depend on the Sn concentration. Raman spectroscopy is an efficient method for obtaining information on the local structure of the disordered material, especially when the composition is varied. In this paper the Raman spectra of As4S3Se3-Sn glasses are presented. The Raman spectra consist of two broad bands located at around =236 cm-1 and =341 cm-1, which corresponds to the symmetric stretching vibration modes of AsSe3/2 and AsS3/2 pyramids.

Keywords

Chalcogenide glasses, X-ray diffraction, Amorphous thin films, Raman spectra.

Submitted at: May 7, 2015
Accepted at: June 24, 2015

Citation

O.V. IASENIUC, M.S. IOVU, G. F. VOLODINA, M. ENACHESCU, D. DINESCU, X-Ray diffraction and Raman spectra of As4S3Se3-Sn glasses, Journal of Optoelectronics and Advanced Materials Vol. 17, Iss. 7-8, pp. 980-984 (2015)