Cookies ussage consent
Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.I agree, do not show this message again.
O.-C. CIOBOTEA-BARBU1,2, I.-A. CIOBOTARU1, D.-I. VAIREANU1,* , D. G. DUMITRAS2, C. NICOLAE2
- University POLITEHNICA of Bucharest, Faculty of Applied Chemistry and Materials Science, 1-7 Polizu Street, 011061, Bucharest, Romania
- Geological Institute of Romania, 1 Caransebes Street, 01227, Bucharest, Romania
This paper presents the characterization of a Ni-Cu thin layer electrodeposited onto a steel substrate. The characterization of these films was performed with X-ray diffraction spectroscopy, Raman spectroscopy and Scanning electron microscopy. The results of the XRD analysis showed a Face Centered Cubic structure and the Raman spectroscopy indicated the presence of Cu2O, CuO and NiO into the films..
Electrodeposited Ni-Cu films, surface analysis, XRD, Raman, SEM.
Submitted at: Oct. 18, 2018
Accepted at: Aug. 20, 2019
O.-C. CIOBOTEA-BARBU, I.-A. CIOBOTARU, D.-I. VAIREANU, D. G. DUMITRAS, C. NICOLAE, XRD, Raman and SEM surface analysis on Ni-Cu electrodeposited layers, Journal of Optoelectronics and Advanced Materials Vol. 21, Iss. 7-8, pp. 536-540 (2019)
- Download Fulltext
- Downloads: 1 (from 1 distinct Internet Addresses ).