Cookies ussage consent
Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.
I agree, do not show this message again.Y2O3:SiO2 binary oxide: synthesis and structural characterization
RACHNA1, P. AGHAMKAR1
Affiliation
- Department of Physics, Materials Science Lab., Ch. Devi Lal University, Sirsa-125055, Haryana, India
Abstract
Y (NO3)3.4H2O and TEOS were used as precursors and powdered form of Y2O3:SiO2 binary oxide was prepared by sol gel process. The powdered sample was annealed at 750o C temperature and characterized by X-ray diffraction, Fourier transforms infrared spectroscopy and transmission electron microscopy. The sample analyzed by FTIR and TEM confirmed the grain size dependency on sintering temperature. Cubic structure of yttrium oxide nanocrystallite with average size ~ 21 nm was obtained at 750 o C (6h) along with crystalline silica..
Keywords
Binary Oxide, Yttrium Oxide, Silica Matrix.
Submitted at: Feb. 18, 2013
Accepted at: Sept. 18, 2013
Citation
RACHNA, P. AGHAMKAR, Y2O3:SiO2 binary oxide: synthesis and structural characterization, Journal of Optoelectronics and Advanced Materials Vol. 15, Iss. 9-10, pp. 1032-1036 (2013)
- Download Fulltext
- Downloads: 756 (from 432 distinct Internet Addresses ).